A Fault-Dictionary Based Diagnosis Framework for Semiconductor Memories

A Fault-Dictionary Based Diagnosis Framework for Semiconductor Memories

碩士 === 國立清華大學 === 電機工程學系 === 88 === Memory is one of the most widely used component in digital systems. Memory production test only provides failed address for repair and simple analysis. For memory design verification and yield enhancement, more detailed information such as fault type an...

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Bibliographic Details
Main Authors:	Chih-Wea Wang, 王志偉
Other Authors:	Cheng-Wen Wu
Format:	Others
Language:	zh-TW
Published:	2000
Online Access:	http://ndltd.ncl.edu.tw/handle/80174935833243658276

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