A Fault-Dictionary Based Diagnosis Framework for Semiconductor Memories
碩士 === 國立清華大學 === 電機工程學系 === 88 === Memory is one of the most widely used component in digital systems. Memory production test only provides failed address for repair and simple analysis. For memory design verification and yield enhancement, more detailed information such as fault type an...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/80174935833243658276 |