Scattering Characteristics of Layered Dielectric Periodical Structures for TE case

碩士 === 國立彰化師範大學 === 工業教育學系 === 88 === ABSTRACT A mode-matching technique in conjunction with Floquet’s theorem is employed to study the scattering characteristics of a new type of periodical structures to an incident TE wave. This structure consists of two dielectrics, in which the profil...

Full description

Bibliographic Details
Main Authors: Wen-Liang Huang, 黃文亮
Other Authors: Ching-Her Lee
Format: Others
Language:en_US
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/58150253422536378848
Description
Summary:碩士 === 國立彰化師範大學 === 工業教育學系 === 88 === ABSTRACT A mode-matching technique in conjunction with Floquet’s theorem is employed to study the scattering characteristics of a new type of periodical structures to an incident TE wave. This structure consists of two dielectrics, in which the profile of the interface is arbitrary. For analysis, we will construct the dispersion relation for each periodical layer, from which the eigenvalues and amplitude coefficients of the wave functions for a characteristic cell can be determined. Once the characteristics of the reflection and transmission of each layer are known the reflection and transmission coefficients of the whole periodical structure can be calculated. In this work, the periodical structures with two cascaded dielectric layers, crisscross and "I"-shaped profiles will be examined. The effects of period, height, incident angle and dielectric constants of the two media on the frequency-selective behavior are investigated. The scattering characteristics of the periodical structure with ground plane in the bottom layer will also be studied. Sample results are presented. Excellent agreements with data available in the literature for some simple structures were observed.