Investigation of GaN material process--Ohmic contact on p-GaN and Eximer laser etching of GaN

碩士 === 國立交通大學 === 光電工程所 === 88 === We study the process of GaN material including ohmic contact on p-GaN and Eximer laser etching of GaN. In ohmic contact, alloy consisted of Ni/Pd/Au film deposited on p-type GaN followed by heat treatment in oxygen condition. A good ohmic characteristic and specifi...

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Main Authors: Yao-Kuo Wang, 王耀國
Other Authors: Shing-Chung Wang
Format: Others
Language:zh-TW
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/46621230251878811346
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spelling ndltd-TW-088NCTU06140082016-07-08T04:22:41Z http://ndltd.ncl.edu.tw/handle/46621230251878811346 Investigation of GaN material process--Ohmic contact on p-GaN and Eximer laser etching of GaN 氮化鎵材料製程研究--p型氮化鎵歐姆接觸與准分子雷射蝕刻 Yao-Kuo Wang 王耀國 碩士 國立交通大學 光電工程所 88 We study the process of GaN material including ohmic contact on p-GaN and Eximer laser etching of GaN. In ohmic contact, alloy consisted of Ni/Pd/Au film deposited on p-type GaN followed by heat treatment in oxygen condition. A good ohmic characteristic and specific contact resistance as low as 1.1 ×10-4Ω-cm2 was obtained at 550℃,5min. Another approach to achieving low-resistance ohmic contact is carrier concentration improvement of p-GaN by Be-implanted . A minimum ρc =4.5×10-4Ω-cm2 and perfect ohmic was obtained by Ni/Pd/Au contact without any heat treatment. In Eximer laser processing, both pulse energy and numbers of pulse of KrF laser were varied to etch the GaN film. By changing the pulsed energy at constant pulse energy, ablation of GaN surface was observed at threshold fluence of 0.3 J/cm2. A high etching rate of 82 nm/sec was obtained at fixed laser fluence of 0.3 J/cm2. Finally, we successfully separate GaN from GaN/sapphire structures using a KrF laser pulse of 1.0 J/cm2. Shing-Chung Wang Wei-Kuo Chen 王興宗 陳衛國 2000 學位論文 ; thesis 93 zh-TW
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language zh-TW
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 光電工程所 === 88 === We study the process of GaN material including ohmic contact on p-GaN and Eximer laser etching of GaN. In ohmic contact, alloy consisted of Ni/Pd/Au film deposited on p-type GaN followed by heat treatment in oxygen condition. A good ohmic characteristic and specific contact resistance as low as 1.1 ×10-4Ω-cm2 was obtained at 550℃,5min. Another approach to achieving low-resistance ohmic contact is carrier concentration improvement of p-GaN by Be-implanted . A minimum ρc =4.5×10-4Ω-cm2 and perfect ohmic was obtained by Ni/Pd/Au contact without any heat treatment. In Eximer laser processing, both pulse energy and numbers of pulse of KrF laser were varied to etch the GaN film. By changing the pulsed energy at constant pulse energy, ablation of GaN surface was observed at threshold fluence of 0.3 J/cm2. A high etching rate of 82 nm/sec was obtained at fixed laser fluence of 0.3 J/cm2. Finally, we successfully separate GaN from GaN/sapphire structures using a KrF laser pulse of 1.0 J/cm2.
author2 Shing-Chung Wang
author_facet Shing-Chung Wang
Yao-Kuo Wang
王耀國
author Yao-Kuo Wang
王耀國
spellingShingle Yao-Kuo Wang
王耀國
Investigation of GaN material process--Ohmic contact on p-GaN and Eximer laser etching of GaN
author_sort Yao-Kuo Wang
title Investigation of GaN material process--Ohmic contact on p-GaN and Eximer laser etching of GaN
title_short Investigation of GaN material process--Ohmic contact on p-GaN and Eximer laser etching of GaN
title_full Investigation of GaN material process--Ohmic contact on p-GaN and Eximer laser etching of GaN
title_fullStr Investigation of GaN material process--Ohmic contact on p-GaN and Eximer laser etching of GaN
title_full_unstemmed Investigation of GaN material process--Ohmic contact on p-GaN and Eximer laser etching of GaN
title_sort investigation of gan material process--ohmic contact on p-gan and eximer laser etching of gan
publishDate 2000
url http://ndltd.ncl.edu.tw/handle/46621230251878811346
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