Fabrication of Microwave Transmission Lines and Characterization of their Dielectric Properties by Electro-optic Sampling Method
碩士 === 國立交通大學 === 電子物理系 === 88 === Coplanar waveguide transmission lines are fabricated for traveling wave measurement by electro-optic sampling system (EOS) which use short pulse Ti:Sapphire Laser as the light source. EOS technique allows accurate and convenient determination of key para...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/90780094418328103428 |
| Summary: | 碩士 === 國立交通大學 === 電子物理系 === 88 === Coplanar waveguide transmission lines are fabricated for traveling wave measurement by electro-optic sampling system (EOS) which use short pulse Ti:Sapphire Laser as the light source. EOS technique allows accurate and convenient determination of key parameters of microwave transmission lines, such as effective dielectric constant at different frequencies and dispersion characteristics. Taking advantage of the sensitivity for phase detection of EOS technique, we measured the phase data of the micro-wave traveling wave in transmission line devices up to 2GHz. Effective dielectric constant for transmission lines on GaN wafers is 5.90 at frequency 1GHz , and is 4.88 at 1GHz and 5.33 at 2GHz for transmission lines on sapphire substrates.
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