Ultrathin GateOxide Thickness Determination

碩士 === 國立交通大學 === 電子工程系 === 88 === Ultrathin Gate Oxide Thickness Determination Student: Ming-Chun Chang Advisor: Ming-Jer Chen National Chiao-Tung University Institute of Electronics Abstract The essential study of th...

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Bibliographic Details
Main Authors: Ming-Chun Chan, 張名君
Other Authors: Ming-Jer Chen
Format: Others
Language:en_US
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/79809825924451147284