Estimating Lifetime Distribution from ADT Data by Nonparametric Regression
碩士 === 國立交通大學 === 統計所 === 88 === We propose a nonparametric regression stochastic process model for accelerated degradation data, which consists of groups of degradation curve data. We assume that different stress levels only affect the degradation speed of the product characteristic, but...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/13565259304921120563 |
| Summary: | 碩士 === 國立交通大學 === 統計所 === 88 === We propose a nonparametric regression stochastic process model for accelerated degradation data, which consists of groups of degradation curve data. We assume that different stress levels only affect the degradation speed of the product characteristic, but not the degradation trend. A method is developed for estimating the lifetime distribution of the ADT (Accelerated Degradation Test) data. By investigating the relationship between the acceleration factors and the stress levels, we can obtain the lifetime distribution of the product under the normal use condition.We apply the method to data obtained from an accelerated degradation test for an LED (light emitting diode) product.The performance of the method is further
checked by a simulated example.
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