The Study of Magnetism and Micro Structure of Magnetic Thin Films Co-Pt-Cr/Cr/AlNi

• Main Authors: Jen-Tai Kwan, 官振台
• Other Authors: Hao Ouyang
• Format: Others
• Language: zh-TW
• Published: 2000
• Online Access: http://ndltd.ncl.edu.tw/handle/93701531098581136523

碩士 === 國立中興大學 === 材料工程學研究所 === 88 === In the manufacturing process of high-density hard disk, the reason of addition of different kinds of alloys with varied compositions is still not very clear. In this work, we used Electron Energy-Lose Spectroscopy, (EELS) to measure the filling of 3d shell, and related to the magnetism for the CoCrPt magnetic thin films. We analyze microstructures and compositions of magnetic thin film from commercial hard disk by Transmission Electron Microscopy, X-ray spectrometer, Auger Electron Spectrometer,(AES) and Electron Spectroscopy for Chemical Analysis,(ESCA). Then we acquire EELS spectrum and compare 3d-occupancy changes with those of pure Co and Cr. The Sequence of multilayer thin films is C/CoCrPt/Cr/AlNi, and the thicknesses of each layer are 5, 20,35,30nm respectively. The grain size of CoCrPt layer is about 10 nm. The magnetic layers have the texture of CoCrPt( ) situated above Cr(112). We found that the Co lost 0.3 d electrons per atom as in the magnetic layer and the Cr lost 2.1 d electrons per atom.