SDH STM-1 155Mb/s Test Set Design

碩士 === 國立中正大學 === 電機工程研究所 === 88 === The high speed optical test equipment is very expensive, and the test equipment are usually manufactured by those famous companies such as HP, Anritsu, Wendle Gottman...and so on. SDH STM-1 is a signal with 155Mb/s bit rate. In the STM-1 test set design, we gener...

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Bibliographic Details
Main Authors: Qi-Nan Liao, 廖啟男
Other Authors: Kou-Tan Wu
Format: Others
Language:en_US
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/57717099117880224380
Description
Summary:碩士 === 國立中正大學 === 電機工程研究所 === 88 === The high speed optical test equipment is very expensive, and the test equipment are usually manufactured by those famous companies such as HP, Anritsu, Wendle Gottman...and so on. SDH STM-1 is a signal with 155Mb/s bit rate. In the STM-1 test set design, we generate byte test pattern into STM-1 payload (VC-4) for testing the VC-4 payload and generate bit test pattern into a time slot (TU-12) of VC-4 for testing the E1 signal. In the firmware design, we use the real time operating system (OS) to handle the procedures for controlling this test set. It initializes devices on system start-up, accepts commands from Keypad, carries out the commands, and displays the results on the LCM Module. In the hardware design, the circuit is laid out in a printed circuit board to avoid interference or noise. In this test set, we integrate many devices to be an useful test equipment and the integrated circuit is designed in a FPGA.