The Theory and Application of Flatting and Shape Measurement in Electronic Scanning Moire Method

• Main Author: 鍾德一
• Other Authors: Tze-Chi Hsu
• Format: Others
• Language: zh-TW
• Published: 1999
• Online Access: http://ndltd.ncl.edu.tw/handle/26819926311085665865

碩士 === 元智大學 === 機械工程研究所 === 87 === In order to attain aim of the measure of none-touch in the way without contacting. My research, according to slide projector projects on the surface of test piece that as be a sample raster by using raster filmslide. We also use slide projector adjustable lens to alters the pitch of sample raster and make the scanning lines of scanning pixel method white we were picking the reflection with CCD camera. Finally, we can examine directly the shape changing in fringe map on the screen and farther control a change by means of the light fringe pitch. In this way, we don’t have to touch the test piece besides can measure the large-area materials even to can draw a diagram of curves of material surface changes by the consequence that we caught. The sensitivity is tending to 0.0019(gradient) and the maximum angle of inclination is 60 degree by using the equipments of my research. Keyword: Electronic Scanning Moire Method , Flatting , linear-mismatch method , Projection-tyap Moire Method.