The Fabrication and Electrical Characterization of Ba(Ti0.8Sn0.2)O3 Thin Films

碩士 === 國立清華大學 === 電子工程研究所 === 87 === In recent years, some perovskite-type ceramic thin films of high dielectric constant have been proposed to be a promising material for charge storage capacitors in Gbit DRAM cells. Regarding their device applications, the electrical properties, such as...

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Bibliographic Details
Main Authors: H. J. Lee, 李宏俊
Other Authors: Prof. Jeng Gong
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/79419039086902859003