Study and Application of Near and Far- Field Sec ond Harmonic

• Main Authors: Hsien-Min Chen, 陳顯旻
• Other Authors: S.C. Wang
• Format: Others
• Language: zh-TW
• Published: 1999
• Online Access: http://ndltd.ncl.edu.tw/handle/28669014097810208314

碩士 === 國立交通大學 === 光電工程所 === 87 === Study and Application of Near and Far-Field Second Harmonic Microscope Student : Hsien-Min Chen Adviser : Prof. C. C. Wang Prof. J. Y. Huang Institute of Electro-Optical Engineering National Chiao Tung University ABSTRACT In this thesis, we have constructed a photo counting system to investigate lower optical signal, and combined photo counting system with near-field scanning optical microscope (NSOM) for research near-field second harmonic images. In far-field, we have used photo counting system to set up a scanning second harmonic microscope. In this system, we investigated GaN and fined some cubic and hexagonal second harmonic images which are different size and brightness. In another system, we combined charge coupled devices with optical microscope. We can use this system to take optical images and different polarization of second harmonic images at the same position. The different positions of GaN induced different situations of second harmonic images which are classified by polarization. In near-field, we used near-field scanning second harmonic microscope to investigate high efficiency of nonlinear crystal (BBO). Simultaneous measurement of the topographic map and second harmonic image allow us to understand the relation between the bright areas and thickness.