Measurements of Nonlinear Optical Properties of ZnSe Doped Glass Thin Films Using Z-Scan
碩士 === 國立交通大學 === 光電工程所 === 87 === ZnSe doped glass thin films were deposited on quartz substrates by KrF pulsed laser deposition form sol-gel targets. The structure of this thin film is semiconductor quantum dots in glass and clearly exhibiting quantum confinement. The property can ind...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/07820625148900262269 |
| Summary: | 碩士 === 國立交通大學 === 光電工程所 === 87 === ZnSe doped glass thin films were deposited on quartz substrates by KrF pulsed laser deposition form sol-gel targets. The structure of this thin film is semiconductor quantum dots in glass and clearly exhibiting quantum confinement. The property can induce an enhancement of third-order optical nonlinearityχ(3) .
The blue shift of the photoluminescence (PL) spectrum shows the effect of quantum confinement. We calculate the coherent length to describe the quality of the thin films from Raman spectra and spatial correlation model. The nonlinear refractive index which were measured by Z-Scan method with Ti: sapphire ultrafast pulse laser (wavelength=790nm) were +1.92×10-8esu to +6.78×10-8esu. This constitutes a significant enhancement over bulk ZnSe.
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