Alternative Photoreflectance Spectroscopy of Semiconductors

碩士 === 國立交通大學 === 電子物理系 === 87 === In this study, we pursued a new and novel method to overcome the intrinsic problem occurred when using the photoreflectance(PR) technique to measure high luminant samples, such as semiconductor quantum wells at low temperature. Many experiments showed th...

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Bibliographic Details
Main Authors: Mao-tsang Chen, 陳茂滄
Other Authors: Su-lin Yang
Format: Others
Language:zh-TW
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/20052871390310280875