Fabrication of High Aspect Ratio Copper Interconnect Using Thick-film Photoresist Process

碩士 === 國立交通大學 === 材料科學與工程系 === 87 === In this work, we formed vias in thick-film photoresist and filled the vias by pulse electroplating process to fabricate the copper(Cu) interconnect with high aspect ratio. The deposition of thick film photoresist, conditions of lithography and pulse electroplati...

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Bibliographic Details
Main Authors: R. C. Chang, 張瑞宗
Other Authors: T. E. Hsieh
Format: Others
Language:zh-TW
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/43217202546488731709

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