SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS

碩士 === 國立成功大學 === 電機工程學系 === 87 === Improving in manufacturing control will be necessary for future generation device technology. A main problem will be the control of deposition and doping at the atomic level. Recently, several growth techniques have been developed to growth d doping lay...

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Main Authors: Tzung-Ting Han, 韓宗廷
Other Authors: Shoou-Jinn Chang
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/89612345927369440328
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spelling ndltd-TW-087NCKU04421032016-07-11T04:13:32Z http://ndltd.ncl.edu.tw/handle/89612345927369440328 SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS 矽鍺系列δ摻雜場效電晶體 Tzung-Ting Han 韓宗廷 碩士 國立成功大學 電機工程學系 87 Improving in manufacturing control will be necessary for future generation device technology. A main problem will be the control of deposition and doping at the atomic level. Recently, several growth techniques have been developed to growth d doping layer in silicon. However, no attempt has been made to our knowledge to use UHV/CVD in this respect. In this thesis, we attempt to grow d -doping layer by UHV/CVD, and to fabricate P-type δ-FET using the same structure. Characterizations of δ doping profile in Si by using secondary ion mass spectroscopy (SIMS) are presented. In this thesis, we also report a p-type SiGe inverted d doped heterostructure field effect transistor and a novel dipole d field effect transistor. At the same time, we also employ MEDICI simulator to investigate the behavior of these devices and to optimize the device structures. Shoou-Jinn Chang San-Lein Wu 張守進 吳三連 1999 學位論文 ; thesis 72 en_US
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language en_US
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description 碩士 === 國立成功大學 === 電機工程學系 === 87 === Improving in manufacturing control will be necessary for future generation device technology. A main problem will be the control of deposition and doping at the atomic level. Recently, several growth techniques have been developed to growth d doping layer in silicon. However, no attempt has been made to our knowledge to use UHV/CVD in this respect. In this thesis, we attempt to grow d -doping layer by UHV/CVD, and to fabricate P-type δ-FET using the same structure. Characterizations of δ doping profile in Si by using secondary ion mass spectroscopy (SIMS) are presented. In this thesis, we also report a p-type SiGe inverted d doped heterostructure field effect transistor and a novel dipole d field effect transistor. At the same time, we also employ MEDICI simulator to investigate the behavior of these devices and to optimize the device structures.
author2 Shoou-Jinn Chang
author_facet Shoou-Jinn Chang
Tzung-Ting Han
韓宗廷
author Tzung-Ting Han
韓宗廷
spellingShingle Tzung-Ting Han
韓宗廷
SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS
author_sort Tzung-Ting Han
title SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS
title_short SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS
title_full SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS
title_fullStr SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS
title_full_unstemmed SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS
title_sort sixge1-x based δ- doped field effect transistors
publishDate 1999
url http://ndltd.ncl.edu.tw/handle/89612345927369440328
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AT hánzōngtíng xìduǒxìlièdcànzáchǎngxiàodiànjīngtǐ
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