SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS
碩士 === 國立成功大學 === 電機工程學系 === 87 === Improving in manufacturing control will be necessary for future generation device technology. A main problem will be the control of deposition and doping at the atomic level. Recently, several growth techniques have been developed to growth d doping lay...
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ndltd-TW-087NCKU04421032016-07-11T04:13:32Z http://ndltd.ncl.edu.tw/handle/89612345927369440328 SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS 矽鍺系列δ摻雜場效電晶體 Tzung-Ting Han 韓宗廷 碩士 國立成功大學 電機工程學系 87 Improving in manufacturing control will be necessary for future generation device technology. A main problem will be the control of deposition and doping at the atomic level. Recently, several growth techniques have been developed to growth d doping layer in silicon. However, no attempt has been made to our knowledge to use UHV/CVD in this respect. In this thesis, we attempt to grow d -doping layer by UHV/CVD, and to fabricate P-type δ-FET using the same structure. Characterizations of δ doping profile in Si by using secondary ion mass spectroscopy (SIMS) are presented. In this thesis, we also report a p-type SiGe inverted d doped heterostructure field effect transistor and a novel dipole d field effect transistor. At the same time, we also employ MEDICI simulator to investigate the behavior of these devices and to optimize the device structures. Shoou-Jinn Chang San-Lein Wu 張守進 吳三連 1999 學位論文 ; thesis 72 en_US |
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碩士 === 國立成功大學 === 電機工程學系 === 87 === Improving in manufacturing control will be necessary for future generation device technology. A main problem will be the control of deposition and doping at the atomic level. Recently, several growth techniques have been developed to growth d doping layer in silicon. However, no attempt has been made to our knowledge to use UHV/CVD in this respect. In this thesis, we attempt to grow d -doping layer by UHV/CVD, and to fabricate P-type δ-FET using the same structure. Characterizations of δ doping profile in Si by using secondary ion mass spectroscopy (SIMS) are presented.
In this thesis, we also report a p-type SiGe inverted d doped heterostructure field effect transistor and a novel dipole d field effect transistor. At the same time, we also employ MEDICI simulator to investigate the behavior of these devices and to optimize the device structures.
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author2 |
Shoou-Jinn Chang |
author_facet |
Shoou-Jinn Chang Tzung-Ting Han 韓宗廷 |
author |
Tzung-Ting Han 韓宗廷 |
spellingShingle |
Tzung-Ting Han 韓宗廷 SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS |
author_sort |
Tzung-Ting Han |
title |
SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS |
title_short |
SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS |
title_full |
SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS |
title_fullStr |
SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS |
title_full_unstemmed |
SiXGe1-X BASED δ- DOPED FIELD EFFECT TRANSISTORS |
title_sort |
sixge1-x based δ- doped field effect transistors |
publishDate |
1999 |
url |
http://ndltd.ncl.edu.tw/handle/89612345927369440328 |
work_keys_str_mv |
AT tzungtinghan sixge1xbasedddopedfieldeffecttransistors AT hánzōngtíng sixge1xbasedddopedfieldeffecttransistors AT tzungtinghan xìduǒxìlièdcànzáchǎngxiàodiànjīngtǐ AT hánzōngtíng xìduǒxìlièdcànzáchǎngxiàodiànjīngtǐ |
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