Controlling ATPG To Improve Testability Problem Caused By Multiple-Branch
碩士 === 國立中興大學 === 資訊科學研究所 === 87 === Abstract With the increase in the complexity of VLSI circuitry, the issues of testing and design-for-testability (DFT) are becoming increasingly important. Considering testability during the early stages of the design flow can have many bene...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/96209898483845471964 |