Investigations on the Electronic and Thermal Behaviors of Deep Submicron MOSFET by Monte Carlo Method
碩士 === 國立清華大學 === 電機工程研究所 === 86 ===
Main Authors: | Lu, Jii-Gen, 陸紀亙 |
---|---|
Other Authors: | Hsu, Yung-Jane |
Format: | Others |
Language: | zh-TW |
Published: |
1998
|
Online Access: | http://ndltd.ncl.edu.tw/handle/64984641921379563997 |
Similar Items
-
Investigation of Low Frequency Noise in Deep-Submicron MOSFET
by: Cheng Nean Chu, et al.
Published: (2002) -
Modeling of Submicron and Deep-submicron MOSFETs Current-Voltage Characteristics
by: Hu, Man-Chun, et al.
Published: (1997) -
Modeling of pre-stress and post-stress submicron and deep submicron MOSFET''s characteristics
by: Liu Shau-Shen, et al.
Published: (1998) -
Elevated source/drain MOSFETs for deep submicron VLSI
by: Waite, Andrew Michael
Published: (1999) -
The Study of Drain Current Model in Deep Submicron MOSFET''s
by: Wen-Tui Liao, et al.
Published: (2001)