Programmable Memory Test Module for Monitored Burn-in

Programmable Memory Test Module for Monitored Burn-in

碩士 === 國立中央大學 === 電機工程學系 === 86 ===

Bibliographic Details
Main Authors: Laio, Kow yuh, 廖國裕
Other Authors: C.C. Su
Format: Others
Language:zh-TW
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/61871463949799324320
id ndltd-TW-086NCU00442049
record_format oai_dc
spelling ndltd-TW-086NCU004420492015-10-13T11:06:16Z http://ndltd.ncl.edu.tw/handle/61871463949799324320 Programmable Memory Test Module for Monitored Burn-in 適用於熱加速之可程式記憶體測試模組 Laio, Kow yuh 廖國裕 碩士 國立中央大學 電機工程學系 86 C.C. Su 蘇朝琴 1998 學位論文 ; thesis 61 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立中央大學 === 電機工程學系 === 86 ===
author2 C.C. Su
author_facet C.C. Su
Laio, Kow yuh
廖國裕
author Laio, Kow yuh
廖國裕
spellingShingle Laio, Kow yuh
廖國裕
Programmable Memory Test Module for Monitored Burn-in
author_sort Laio, Kow yuh
title Programmable Memory Test Module for Monitored Burn-in
title_short Programmable Memory Test Module for Monitored Burn-in
title_full Programmable Memory Test Module for Monitored Burn-in
title_fullStr Programmable Memory Test Module for Monitored Burn-in
title_full_unstemmed Programmable Memory Test Module for Monitored Burn-in
title_sort programmable memory test module for monitored burn-in
publishDate 1998
url http://ndltd.ncl.edu.tw/handle/61871463949799324320
work_keys_str_mv AT laiokowyuh programmablememorytestmoduleformonitoredburnin
AT liàoguóyù programmablememorytestmoduleformonitoredburnin
AT laiokowyuh shìyòngyúrèjiāsùzhīkěchéngshìjìyìtǐcèshìmózǔ
AT liàoguóyù shìyòngyúrèjiāsùzhīkěchéngshìjìyìtǐcèshìmózǔ
_version_ 1716837666165620736

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