TRL De-embedding Method

• Main Authors: Cheng, Kai-Fang, 鄭凱方
• Other Authors: Chang Chi-Yang
• Format: Others
• Language: zh-TW
• Published: 1998
• Online Access: http://ndltd.ncl.edu.tw/handle/08284476194952288628

碩士 === 國立交通大學 === 電信工程研究所 === 86 === In this thesis, a so-called TRL (Through, Line, Reflection) de-embedding method is developed. The method of de-embedding includes 3 basic structure S-parameter measurements, namely, through, line and reflection, and one device S-parameter measurement. A FORTRAN program based on TRL de-embedding theory is developed. An NEC71000 MESFET is tested to verify the validity of the program. The de-embedded data are very close to the data from NEC data sheet. The program can also provide reflection coefficient data of any kind of line discontinuities such as open-end and short-end. We utilize this method to make a CPW open-end and short-end measurements, and uses HP series to model the equivalent circuits.