| Summary: | 碩士 === 中華大學 === 電機工程研究所 === 86 === Integration of micro-electronic technology is becoming more and more important and highly emphasized in the industry development. IC designers have found that mixed-signal circuits, not only digital circuits, can be widely used in various applications. Although it emerges as a leader, howevermixed signal device testing is still under development and becomes a new challenge. Besides, the testing strategy and items of mixed-signal ICs may vary dramatically for different products. Hence, in this thesis, we use PCM CODEC and RAMDAC as analysis samples, applying DSP-based techniques, to issue a guide-view which can meet testing requirements during verification stage and production stage for similar products.
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