Using Atomic Force Microscopy to image Microscale and Nanoscale Surface
碩士 === 國立中正大學 === 化學研究所 === 86 === The main focuses of this thesis are to study the patterned surfaces of self-assembled monolayers and to characterize nano- sized metal materialsby scanning probe microscopy.In the first part, we have prepared the pattern...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1998
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| Online Access: | http://ndltd.ncl.edu.tw/handle/82203850563717739237 |