Investigation of Nucleation and Growth of Electropolymerization of Aniline on HOPG via Atomic Force Microscope

碩士 === 國立台灣工業技術學院 === 化學工程技術研究所 === 85 === The nucleation and growth behavior of the electropolymerization of aniline on highly oriented pyrolytic graphite (HOPG) substrate was investigated via cyclic voltammetry (CV) , chronoamperm...

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Bibliographic Details
Main Authors: Wu, Chung-Ru, 吳宗儒
Other Authors: Hwang Bing-Joe, Ho K.C.
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/17655772686782853925
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Summary:碩士 === 國立台灣工業技術學院 === 化學工程技術研究所 === 85 === The nucleation and growth behavior of the electropolymerization of aniline on highly oriented pyrolytic graphite (HOPG) substrate was investigated via cyclic voltammetry (CV) , chronoampermetry (CA) , and atomic force microscope (AFM). The current-time (i-t) curves for the electropolymerization of aniline in aqueous solution are categorized into two kinds . One kind of the i-t curves is believed to be the behavior of the 3-dimension (3D) nucleation and growth by comparing the theoretical and experimental data but the other one is unclear. From the observation of AFM, the behavior was found to be typical 3D-progressive nucleation and growth when the higher potential(1.1V≦E≦2.0V) was applied. However , the 3D-progressive and 2D-instantaneous nucleation and growth occurred simultaneously when the lower potential (0.8V ≦E≦1.0V) was applied. The coexistence of 3D-progressive and 2D-instantaneous nucleation and growth during the electropolymerization of aniline in aqueous solution was concluded from the combination of i-t curves and AFM observation. The behavior of the electropolymerization of aniline in organic solution was suggested to be the coexistence of 3D-progressive and 3D-instantaneous nucleation and growth via the observation of AFM, and layer by layer growth from the analysis of i-t curves . The behavior of nucleation andgrowth can be distinguished more clearly with the combination of i-t responses and the observation of AFM which can compensate for the disadvantages resulting from the observation only by one of the methods.