Angular distributions of sputtered particles from the single crystal
碩士 === 國立臺灣大學 === 化學系研究所 === 85 === Secondary Ion Mass Spectrometry is a surface-sensitive technique for det ermining chemical bonding geometry on the surface. In fact, the angular distri bution of the secondary particles is a useful information in...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/91502019396965575510 |