An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors

碩士 === 國立清華大學 === 電機工程學系 === 85 ===

Bibliographic Details
Main Authors: Kao, Shih chieh, 高世杰
Other Authors: Joseph Ya-min Lee
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/01622594057271344692
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spelling ndltd-TW-085NTHU04421172015-10-13T18:05:33Z http://ndltd.ncl.edu.tw/handle/01622594057271344692 An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors 鋯鈦酸鉛(PZT)電容器依時性介電崩潰(TDDB)及尺寸效應之研究 Kao, Shih chieh 高世杰 碩士 國立清華大學 電機工程學系 85 Joseph Ya-min Lee 李雅明 1997 學位論文 ; thesis 80 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立清華大學 === 電機工程學系 === 85 ===
author2 Joseph Ya-min Lee
author_facet Joseph Ya-min Lee
Kao, Shih chieh
高世杰
author Kao, Shih chieh
高世杰
spellingShingle Kao, Shih chieh
高世杰
An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors
author_sort Kao, Shih chieh
title An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors
title_short An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors
title_full An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors
title_fullStr An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors
title_full_unstemmed An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors
title_sort investigation of time dependent dielectric breakdown(tddb) and size effect of ferroelectric thin film capacitors
publishDate 1997
url http://ndltd.ncl.edu.tw/handle/01622594057271344692
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