An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors

• Main Authors: Kao, Shih chieh, 高世杰
• Other Authors: Joseph Ya-min Lee
• Format: Others
• Language: zh-TW
• Published: 1997
• Online Access: http://ndltd.ncl.edu.tw/handle/01622594057271344692

碩士 === 國立清華大學 === 電機工程學系 === 85 ===