An Investigation of Time Dependent Dielectric Breakdown(TDDB) and Size Effect of Ferroelectric Thin Film Capacitors

碩士 === 國立清華大學 === 電機工程學系 === 85 ===

Bibliographic Details
Main Authors: Kao, Shih chieh, 高世杰
Other Authors: Joseph Ya-min Lee
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/01622594057271344692