| Summary: | 碩士 === 國立清華大學 === 物理學系 === 85 === We have carried out a systematic study on the effect of film
thickness to the physical properties of superconducting Nb thin
films prepared by sputtering technique. We observed that
several properties such as the residual conductivity,
superconducting transition temperature TC, upper critical field
HC2, I-V characteristics, and the effective coherence length,
are characteristically different for films thicker or thinner
than 80 nm. Detailed analysis of the data suggest that the
observed behavior are related to the dimensional crossover of
the studied films. The characteristic of the films that is
thicker than 80 nmis 3-dimensional, while those with thickness
less than 80nm behave more like 2-dimensional system.
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