Low Pressure Chemical Vapor Deposited Tungsten for ULSI Applications

博士 === 國立交通大學 === 電子工程學系 === 85 === This thesis studies properties of the low pressure chemical vapor deposited tungsten film (CVD-W) for ultra-large-scale- integrated (ULSI) circuit applications. The deposition mechanisms of selective CVD-W filling on su...

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Bibliographic Details
Main Authors: Yeh, Ta-Hsun, 葉達勳
Other Authors: Chang Kow-Ming
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/15972619170031560324

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