The Study of Global Production Lot Sizing in Wafer Fabrication Measured by Cycle time
碩士 === 國立交通大學 === 工業工程與管理學系 === 85 === To gain the competitive advantage, cycle time reduction is one of the most critical issues in wafer fabrication (especiallyin wafer foundries). Due to the recession of semiconductorindustry in 1996,...
Main Authors: | Chang, Yi-Cheng, 張益誠 |
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Other Authors: | Lee Ching-En |
Format: | Others |
Language: | zh-TW |
Published: |
1997
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Online Access: | http://ndltd.ncl.edu.tw/handle/69198597320089758590 |
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