The Study of Global Production Lot Sizing in Wafer Fabrication Measured by Cycle time

碩士 === 國立交通大學 === 工業工程與管理學系 === 85 === To gain the competitive advantage, cycle time reduction is one of the most critical issues in wafer fabrication (especiallyin wafer foundries). Due to the recession of semiconductorindustry in 1996,...

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Bibliographic Details
Main Authors: Chang, Yi-Cheng, 張益誠
Other Authors: Lee Ching-En
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/69198597320089758590