A Study of Effective Carrier Mobility Extraction in MOSFETs

A Study of Effective Carrier Mobility Extraction in MOSFETs

碩士 === 大葉工學院 === 電機工程研究所 === 85 ===

Bibliographic Details
Main Authors:	Shih, Hsin-Yang, 石信揚
Other Authors:	Shen-Li Chen
Format:	Others
Language:	zh-TW
Published:	1997
Online Access:	http://ndltd.ncl.edu.tw/handle/85712970200761587049

Similar Items

Stress Analysis and Carrier Mobility Calculation of InGaAs MOSFETs
by: Hsiang Ou-Yang, et al.
Published: (2012)

Hot-carrier effects and NBTI in MOSFET''s
by: Yu-Sen Ou, et al.
Published: (2003)

Studies on Hot-Carrier effects in High-Voltage Lateral-Diffused MOSFETs
by: Shih-hui Chen, et al.
Published: (2003)

Hot-Carrier Effect of Strained-Silicon MOSFETs
by: Sa, Yu-Huan, et al.
Published: (2008)

Hot Carrier Effect Induced Degradation in MOSFET’s
by: Chiou-Tian Ho, et al.
Published: (2001)

Investigation on the Reliability and Hot Carrier degradation in Advance MOSFET
by: Ying-Hsin Lu, et al.
Published: (2018)

Mobility Parameters Extraction of SOI MOSFET and Self-Heating Study
by: Huang,Sheng Kuo, et al.
Published: (1996)

MOBILITY PARAMETERS EXTRACTION OF SOI MOSFET AND SELF－HEATING STUDY
by: Huang, Sheng-Guo, et al.
Published: (1996)

Low Voltage Hot Carrier Effects in Submicron MOSFET's
by: Jiun-Chiang Chen, et al.
Published: (1995)

Study of Externally Compressive Mechanical Stress on Performance and Carrier Transport Mechanism of MOSFETs
by: Liu, Hsin-Liang, et al.
Published: (2010)

Carrier Mobility for MOSFET Using SiGe-Source/Drain on (110) Wafer Surface
by: Wei-Luen Huang, et al.
Published: (2010)

Experimental Investigation of Carrier Mobility considering Various Scattering Mechanisms for Uniaxial Strained MOSFETs
by: Chen, Po-Nien, et al.
Published: (2010)

Studies on Hot-Carrier Reliability in High-Voltage MOSFETs
by: Jia-Rui Lee, et al.
Published: (2008)

ILFD Using Dual Injection MOSFETs and Hot-Carrier Effects
by: Shun-Shing Tseng, et al.
Published: (2014)

A Study of Hot-Carrier Effects in MOSFETs by the Low Frequency 1/f Noise Spectrum
by: Yang, Hsiao-Kuang, et al.
Published: (1997)

A study of parameter extraction of the mosfet
by: ZHANG, WEN-YUE, et al.
Published: (1988)

Hot-Carrier Degradation of N-Type MOSFET under Various Bias Condition
by: Shih-AnCheng, et al.
Published: (2017)

Effects of IMD and Nitride Spacer on Hot Carrier Induced MOSFET Degradation
by: 劉維理
Published: (1999)

The effects of strain on carrier transport in thin and ultra-thin SOI MOSFETs
by: Lauer, Isaac, 1976-
Published: (2006)

The extraction of MOSFET parameters.
Published: (1988)

Hot-carrier reliability of MOSFETs at room and cryogenic temperature
by: Kim, SeokWon Abraham, 1970-
Published: (2005)

Analysis of hot-carrier AC lifetime model for MOSFET
by: Menberu, Beniyam
Published: (2007)

Interface defect engineering for high-performance MOSFETs with novel carrier mobility model: Theory and experimental verification
by: Takamitsu Ishihara, et al.
Published: (2020-05-01)

Hot-Carrier Effect and Negative Bias Temperature Instability of Narrow-Width pMOSFET's
by: Ming-Jeng Yang, et al.
Published: (2003)

The fabrication of Si1-xGex MOSFET
by: Ching-Chieh Shih, et al.
Published: (2003)

NBTI-like Hot-Carrier Effect of SOI pMOSFET's with 1.3nm Gate Oxide
by: Shih Cheng Hung, et al.
Published: (2004)

Studies on Hot-Carrier Induced Degradation for Deep Submicron and Nanometer MOSFETs
by: Shuang-Yuan Chen, et al.
Published: (2007)

An experimental and theoretical study of the hot-carrier energy distribution in VLSI MOSFETs
by: Al-Harbi, Talal S.
Published: (1996)

Study on the Temperature Effect of Substrate Current Influenced by the Hot-Carrier Effects in N-Channel MOSFETs
by: Wen-Chung Chang, et al.
Published: (1995)

Hot-Carrier and Bias Temperature Instability Effects on 90 nm Node MOSFETs
by: Ai-Erh Chuang, et al.
Published: (2008)

Hot-Carrier and Bias Temperature Instability Effects on 90 nm Node MOSFETs
by: Ai-Erh Chuang, et al.
Published: (2008)

On the relationship between carrier mobility and velocity in sub-50 mm MOSFETs via calibrated Monte Carlo simulation
by: Nayfeh, Osama Munir, 1980-
Published: (2005)

Comparative Analysis of Carrier Statistics on MOSFET and Tunneling FET Characteristics
by: Dan Li, et al.
Published: (2015-01-01)

Automated MOSFET parameter extraction
by: Lui, Jerome C. (Jerome Chun Lung)
Published: (2007)

Study of Subthreshold Behavior for the Dual-Material Surrounding-Gate MOSFETs
by: Wang, Hsin-Kai, et al.
Published: (2008)

Application Fuzzy Statistics Control Charts in MOSFET
by: Hsin-Chuan Peng, et al.
Published: (2010)

Fundamental Study on Carrier Transport in Si Nanowire MOSFETs with Smooth Nanowire Surfaces
by: Morioka, Naoya
Published: (2014)

Experimental Study of Carrier Transport and Important Device Parameters for Nanoscale Si MOSFETs
by: Lee, Wei, et al.
Published: (2009)

Development and Hot-Carrier Reliability Study of Integrated High-Voltage MOSFET Transistors
by: Kuo-Ming Wu, et al.
Published: (2007)

Elevated Temperature Hot-Carrier Effects on 90 nm Narrow-Width nMOSFETs
by: Li-Wei Wu, et al.
Published: (2008)

Cannot write session to /tmp/vufind_sessions/sess_mc51jjuvo6l5p4nvkaqf21eps6