Ultra High Density Near-field Optical Data Storage

• Main Authors: Guo, Wen Rei, 郭文瑞
• Other Authors: Din Ping Tsai
• Format: Others
• Language: zh-TW
• Published: 1997
• Online Access: http://ndltd.ncl.edu.tw/handle/32227866953731247599

碩士 === 國立中正大學 === 物理學系 === 85 === ABSTRACT Near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe has been successfully developed to perform optical recording on the surface of cyanine (C35H35ClN2O4) dye layer or Ge21Te26Sb53 phase change (PC) thin film. Near-field optical writing bits less than 40 nm in diameter were shown on the cyanine dye layer of a commercial compact disk-recordable (CD-R) by atomic force microscope (AFM) images of our tapping mode NSOM. For Ge21Te26Sb53 PC thin film, an internal reflection mode NSOM was built to achieve both optical writing and reading, and the results showed a diameter of 500 nm recording bits.