Ultra High Density Near-field Optical Data Storage
碩士 === 國立中正大學 === 物理學系 === 85 === ABSTRACT Near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe has been successfully developed to perform optical recording on the surface of cyanine (C35H3...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/32227866953731247599 |
| Summary: | 碩士 === 國立中正大學 === 物理學系 === 85 === ABSTRACT
Near-field scanning optical microscope (NSOM) system with a bent
or a straight optical fiber probe has been successfully
developed to perform optical recording on the surface of
cyanine (C35H35ClN2O4) dye layer or Ge21Te26Sb53 phase change
(PC) thin film. Near-field optical writing bits less than 40 nm
in diameter were shown on the cyanine dye layer of a
commercial compact disk-recordable (CD-R) by atomic force
microscope (AFM) images of our tapping mode NSOM. For
Ge21Te26Sb53 PC thin film, an internal reflection mode NSOM
was built to achieve both optical writing and reading, and the
results showed a diameter of 500 nm recording bits.
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