Characterization of Cadmium Telluride by Deep-Level Transient Spectroscopy
碩士 === 國立臺灣科技大學 === 電子工程學系 === 84 === The developement of a simple and low-cost deep-level transient spectroscopy (DLTS) system automated with a microcomputer for the analysis of semiconductor device is the main purpose of this work.By usin...
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| Format: | Others |
| Language: | zh-TW |
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1996
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| Online Access: | http://ndltd.ncl.edu.tw/handle/47195768675374535092 |