Study of submicron contact reliability
碩士 === 國立清華大學 === 電機工程研究所 === 84 ===
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| Format: | Others |
| Language: | zh-TW |
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1996
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| Online Access: | http://ndltd.ncl.edu.tw/handle/56715857865465816081 |
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ndltd-TW-084NTHU0442075 |
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oai_dc |
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ndltd-TW-084NTHU04420752016-07-13T04:10:35Z http://ndltd.ncl.edu.tw/handle/56715857865465816081 Study of submicron contact reliability 次微米接觸之可靠性研究 Chen, Wei Sheng 陳瑋聲 碩士 國立清華大學 電機工程研究所 84 Hsu Yung Jane 徐永珍 1996 學位論文 ; thesis 0 zh-TW |
| collection |
NDLTD |
| language |
zh-TW |
| format |
Others
|
| sources |
NDLTD |
| description |
碩士 === 國立清華大學 === 電機工程研究所 === 84 ===
|
| author2 |
Hsu Yung Jane |
| author_facet |
Hsu Yung Jane Chen, Wei Sheng 陳瑋聲 |
| author |
Chen, Wei Sheng 陳瑋聲 |
| spellingShingle |
Chen, Wei Sheng 陳瑋聲 Study of submicron contact reliability |
| author_sort |
Chen, Wei Sheng |
| title |
Study of submicron contact reliability |
| title_short |
Study of submicron contact reliability |
| title_full |
Study of submicron contact reliability |
| title_fullStr |
Study of submicron contact reliability |
| title_full_unstemmed |
Study of submicron contact reliability |
| title_sort |
study of submicron contact reliability |
| publishDate |
1996 |
| url |
http://ndltd.ncl.edu.tw/handle/56715857865465816081 |
| work_keys_str_mv |
AT chenweisheng studyofsubmicroncontactreliability AT chénwěishēng studyofsubmicroncontactreliability AT chenweisheng cìwēimǐjiēchùzhīkěkàoxìngyánjiū AT chénwěishēng cìwēimǐjiēchùzhīkěkàoxìngyánjiū |
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