The Analysis of factors affecting the cycle time of IC testing

碩士 === 國立清華大學 === 工業工程研究所 === 84 ===

Bibliographic Details
Main Authors:	Tseng, Li Jang, 曾麗娟
Other Authors:	Chen Guang Chern
Format:	Others
Language:	zh-TW
Published:	1996
Online Access:	http://ndltd.ncl.edu.tw/handle/26054450202191694039

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spelling	ndltd-TW-084NTHU00300352015-10-13T14:34:59Z http://ndltd.ncl.edu.tw/handle/26054450202191694039 The Analysis of factors affecting the cycle time of IC testing 影響IC測試交期的原因分析 Tseng, Li Jang 曾麗娟碩士國立清華大學工業工程研究所 84 Chen Guang Chern 陳光辰 1996 學位論文 ; thesis 0 zh-TW
collection	NDLTD
language	zh-TW
format	Others
sources	NDLTD
description	碩士 === 國立清華大學 === 工業工程研究所 === 84 ===
author2	Chen Guang Chern
author_facet	Chen Guang Chern Tseng, Li Jang 曾麗娟
author	Tseng, Li Jang 曾麗娟
spellingShingle	Tseng, Li Jang 曾麗娟 The Analysis of factors affecting the cycle time of IC testing
author_sort	Tseng, Li Jang
title	The Analysis of factors affecting the cycle time of IC testing
title_short	The Analysis of factors affecting the cycle time of IC testing
title_full	The Analysis of factors affecting the cycle time of IC testing
title_fullStr	The Analysis of factors affecting the cycle time of IC testing
title_full_unstemmed	The Analysis of factors affecting the cycle time of IC testing
title_sort	analysis of factors affecting the cycle time of ic testing
publishDate	1996
url	http://ndltd.ncl.edu.tw/handle/26054450202191694039
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The Analysis of factors affecting the cycle time of IC testing

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