W Contacted P+N Junction Diode Using Selective W-CVD

碩士 === 國立交通大學 === 電子研究所 === 84 === This thesis studies the W contacted p+n junction diode with the W film deposited using the selective W-CVD technique. For the Cu/W/p+n junction diode with a W layer of 300 nm, a thermal treatment at 600...

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Bibliographic Details
Main Authors: Chen, Shin-Huei, 陳昕輝
Other Authors: Chen Mao-Chieh
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/30336415065269209489