Electrostatic Discharge and Alpha Particle Upset in Deep Submicron CMOS

碩士 === 國立交通大學 === 電子研究所 === 84 === Two-dimensional mixed-mode circuit and device simulation taking into account the lattice temperature as well as the photogeneration has extensively been performed to examine the two concerned issues in...

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Bibliographic Details
Main Authors: Fan, Hung-Cheng, 范宏政
Other Authors: Chen Ming-Jer
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/27628463954334094312