The preparation and characterization of PbTiO3 ferroelectric thin film for non-volatile memory application

碩士 === 國立成功大學 === 電機工程研究所 === 84 === Due to the good ferroelectric、piezoelectric and pyroelectric proper-ties,PbTiO3 thin film is widely applied to some electronic devices。In this thesis,we successfully grow a well crystallized PbTiO3 thin...

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Bibliographic Details
Main Authors: Hwei Hsiang Shih, 施輝祥
Other Authors: Yean Kaun Fang
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/35747598186861695808
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Summary:碩士 === 國立成功大學 === 電機工程研究所 === 84 === Due to the good ferroelectric、piezoelectric and pyroelectric proper-ties,PbTiO3 thin film is widely applied to some electronic devices。In this thesis,we successfully grow a well crystallized PbTiO3 thin film on silicon wafer by rf-magnetron sputtering。Its relative dielec-tric constant (εγ) will increase with the thickness of Pb6TiO3 ferro-electric thin film 。Its maximum value is 33.17 within the thin film thi- ckness range of the device。At the application of nonvalitile memory, we propose the bulk channel floating gate FET as our device*s structure。Comparing with the general ferroelectric memory,we decrease the writing voltage to 10 Volt and the access time is smaller than 150nsec。We can also get the ON/OFF channel conductivity ratio of 54 with a 5 Volt bias voltage between drain and source。