A Study of -SiC/Si Multilayer Heterojunction structures for Photodetector Applications

碩士 === 國立成功大學 === 電機工程研究所 === 84 === In this thesis, single-crystal SiC / single-crystal Si ultilayer heterojunction photodetectors were fabricatedn Si substrates by rapid thermal chemical vaporeposition (RTCVD) method. Three...

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Main Authors: Jing Hong Zhou, 周景弘
Other Authors: Yean Kaun Fang
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/79403586537486847590
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spelling ndltd-TW-084NCKU04420142016-02-05T04:16:28Z http://ndltd.ncl.edu.tw/handle/79403586537486847590 A Study of -SiC/Si Multilayer Heterojunction structures for Photodetector Applications 單晶碳化矽/單晶矽複層異質接面光檢測器之研製 Jing Hong Zhou 周景弘 碩士 國立成功大學 電機工程研究所 84 In this thesis, single-crystal SiC / single-crystal Si ultilayer heterojunction photodetectors were fabricatedn Si substrates by rapid thermal chemical vaporeposition (RTCVD) method. Three different devices' tructures were proposed, that is , (1) double- eterojunction (n+-Si/i-SiC/p+Si), (2) single- eterojunction (n+-SiC/i-SiC/p+-Si) and (3) homojunctiontructure. The optoelectronic characteristics of devicesnclude optical gain, responsivity and response speed wereeasured and analyzed to check the suitability for thepplications in optoelectronic devices.Based on thexperimental results, we find that, among the threeifferent structures, the photodetector with homojunctiontructure possesses the best optoelectronicharacteristics. Its dark current is 25A( under 15.4Veversed bias), and optical gain is 96.6(under 5W incidentptical power) .The peak value of absorption wavelength inpectrum response is 480nm. The response speed is 9.5s forise time and 11.0s for fall time. Yean Kaun Fang 方炎坤 1996 學位論文 ; thesis 9 zh-TW
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language zh-TW
format Others
sources NDLTD
description 碩士 === 國立成功大學 === 電機工程研究所 === 84 === In this thesis, single-crystal SiC / single-crystal Si ultilayer heterojunction photodetectors were fabricatedn Si substrates by rapid thermal chemical vaporeposition (RTCVD) method. Three different devices' tructures were proposed, that is , (1) double- eterojunction (n+-Si/i-SiC/p+Si), (2) single- eterojunction (n+-SiC/i-SiC/p+-Si) and (3) homojunctiontructure. The optoelectronic characteristics of devicesnclude optical gain, responsivity and response speed wereeasured and analyzed to check the suitability for thepplications in optoelectronic devices.Based on thexperimental results, we find that, among the threeifferent structures, the photodetector with homojunctiontructure possesses the best optoelectronicharacteristics. Its dark current is 25A( under 15.4Veversed bias), and optical gain is 96.6(under 5W incidentptical power) .The peak value of absorption wavelength inpectrum response is 480nm. The response speed is 9.5s forise time and 11.0s for fall time.
author2 Yean Kaun Fang
author_facet Yean Kaun Fang
Jing Hong Zhou
周景弘
author Jing Hong Zhou
周景弘
spellingShingle Jing Hong Zhou
周景弘
A Study of -SiC/Si Multilayer Heterojunction structures for Photodetector Applications
author_sort Jing Hong Zhou
title A Study of -SiC/Si Multilayer Heterojunction structures for Photodetector Applications
title_short A Study of -SiC/Si Multilayer Heterojunction structures for Photodetector Applications
title_full A Study of -SiC/Si Multilayer Heterojunction structures for Photodetector Applications
title_fullStr A Study of -SiC/Si Multilayer Heterojunction structures for Photodetector Applications
title_full_unstemmed A Study of -SiC/Si Multilayer Heterojunction structures for Photodetector Applications
title_sort study of -sic/si multilayer heterojunction structures for photodetector applications
publishDate 1996
url http://ndltd.ncl.edu.tw/handle/79403586537486847590
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