The magnetic and transport properties of Co-Cr(Mo,V) thin films and multilayers.

• Main Authors: Liao, Szu-Ya, 廖思雅
• Other Authors: Y. D. Yao
• Format: Others
• Language: zh-TW
• Published: 1996
• Online Access: http://ndltd.ncl.edu.tw/handle/11623186406477567743

碩士 === 輔仁大學 === 物理學系 === 84 === Epitaxial Co/Cr(Mo,V) thin films, bilayered films and multilayers have been successfully grown on the MgO(100) and MgO(110) substrates by molecularbeam epitaxy (MBE). The magnetic and transport properties have been studied,especially emphasized on the magnetic anisotropy and magnetoresistance. According to the reflection high energy electron diffraction (RHEED) patternsand x-ray diffraction (XRD) measurements,the crystalstructure of the films depends on the orientation of the buffer layer and substrate. The magnetic properties of all these samples were studied by using a superconducting quantum interference device (SQUID) magnetometer. The magnetoresistive properties were measured by the standard four probe technique between 10 K to 300 K. According to the above measurements and analysis,the bilayered films and multilayers which have the same structure of the same unit cells show the similar magnetic anisotropy and magnetoresistance. For hcp-Co/Cr(211) bilayers and multilayers grown on MgO(110),the enhancement of anisotropic magnetoresistance (AMR) as high as 8~12% can be observed along the easy axis(c axis) at 10 K. It explained why we can not see obvious giant magnetoresistance (GMR) effect in Co/Cr multilayer system and also provided one way to know the sources of magnetoresistance.