Accurate Modeling of Back-Gate Bias and Temperature Effect in Weakly Inverted MOSFETs

碩士 === 國立交通大學 === 電子研究所 === 83 === A simple and accurate model describing the dc behavior of MSOFET operated in weak inversion is derived empirically based on the physically-based formulation. This model includes only four parmeters a...

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Bibliographic Details
Main Authors: Shih-Chun Fu, 符識鈞
Other Authors: Ming-Jer Chen
Format: Others
Language:en_US
Published: 1995
Online Access:http://ndltd.ncl.edu.tw/handle/01763708188743191034