A design and an automatic generation system for mixed-mode boundary scan with DC and AC testing capability
碩士 === 國立成功大學 === 電機工程研究所 === 83 === Current technologies for manufacturing VLSI and PCB circuits are so complex that the traditional testing method cannot deal well with these circuits. This problem can be effectively solved by using digit...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/31229690495768592982 |