A Design of Deletion/Insertion Correcting Runlength-Limited Code

碩士 === 國立清華大學 === 電機工程研究所 === 82 === A bit deletion or insertion will result in a catastrophic destruction in data transmission. Both error events are called synchronization errors. In this thesis, we discuss techniques which transfer synch...

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Main Authors: Tsung-Hui Chen, 陳宗慧
Other Authors: Chung-Chin Lu
Format: Others
Language:zh-TW
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/54053939670754479439
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spelling ndltd-TW-082NTHU04420592016-07-18T04:09:49Z http://ndltd.ncl.edu.tw/handle/54053939670754479439 A Design of Deletion/Insertion Correcting Runlength-Limited Code 可更正位元刪除/插入的連續相同符號長度限制碼 Tsung-Hui Chen 陳宗慧 碩士 國立清華大學 電機工程研究所 82 A bit deletion or insertion will result in a catastrophic destruction in data transmission. Both error events are called synchronization errors. In this thesis, we discuss techniques which transfer synchronization errors into bursty erasures by periodically inserting a synchronization sequence into data sequences. Erasures can be corrected by an outer error- correcting code. Extensions of these techniques to runlength- limited sequences which are commonly used in magnetic (optical) storage systems are proposed. When the number of synchronization errors is over the capacity of the synchronization sequence, thesis techniques may cause block- level deletions or insertions. We propose two methods to avoid this undesired phenomena. Properties of synchronization sequences to runlength-limited sequences, their performance, and the related coding problems are investigated. Chung-Chin Lu 呂忠津 1994 學位論文 ; thesis 60 zh-TW
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language zh-TW
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sources NDLTD
description 碩士 === 國立清華大學 === 電機工程研究所 === 82 === A bit deletion or insertion will result in a catastrophic destruction in data transmission. Both error events are called synchronization errors. In this thesis, we discuss techniques which transfer synchronization errors into bursty erasures by periodically inserting a synchronization sequence into data sequences. Erasures can be corrected by an outer error- correcting code. Extensions of these techniques to runlength- limited sequences which are commonly used in magnetic (optical) storage systems are proposed. When the number of synchronization errors is over the capacity of the synchronization sequence, thesis techniques may cause block- level deletions or insertions. We propose two methods to avoid this undesired phenomena. Properties of synchronization sequences to runlength-limited sequences, their performance, and the related coding problems are investigated.
author2 Chung-Chin Lu
author_facet Chung-Chin Lu
Tsung-Hui Chen
陳宗慧
author Tsung-Hui Chen
陳宗慧
spellingShingle Tsung-Hui Chen
陳宗慧
A Design of Deletion/Insertion Correcting Runlength-Limited Code
author_sort Tsung-Hui Chen
title A Design of Deletion/Insertion Correcting Runlength-Limited Code
title_short A Design of Deletion/Insertion Correcting Runlength-Limited Code
title_full A Design of Deletion/Insertion Correcting Runlength-Limited Code
title_fullStr A Design of Deletion/Insertion Correcting Runlength-Limited Code
title_full_unstemmed A Design of Deletion/Insertion Correcting Runlength-Limited Code
title_sort design of deletion/insertion correcting runlength-limited code
publishDate 1994
url http://ndltd.ncl.edu.tw/handle/54053939670754479439
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