A Design of Deletion/Insertion Correcting Runlength-Limited Code
碩士 === 國立清華大學 === 電機工程研究所 === 82 === A bit deletion or insertion will result in a catastrophic destruction in data transmission. Both error events are called synchronization errors. In this thesis, we discuss techniques which transfer synch...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
1994
|
Online Access: | http://ndltd.ncl.edu.tw/handle/54053939670754479439 |
id |
ndltd-TW-082NTHU0442059 |
---|---|
record_format |
oai_dc |
spelling |
ndltd-TW-082NTHU04420592016-07-18T04:09:49Z http://ndltd.ncl.edu.tw/handle/54053939670754479439 A Design of Deletion/Insertion Correcting Runlength-Limited Code 可更正位元刪除/插入的連續相同符號長度限制碼 Tsung-Hui Chen 陳宗慧 碩士 國立清華大學 電機工程研究所 82 A bit deletion or insertion will result in a catastrophic destruction in data transmission. Both error events are called synchronization errors. In this thesis, we discuss techniques which transfer synchronization errors into bursty erasures by periodically inserting a synchronization sequence into data sequences. Erasures can be corrected by an outer error- correcting code. Extensions of these techniques to runlength- limited sequences which are commonly used in magnetic (optical) storage systems are proposed. When the number of synchronization errors is over the capacity of the synchronization sequence, thesis techniques may cause block- level deletions or insertions. We propose two methods to avoid this undesired phenomena. Properties of synchronization sequences to runlength-limited sequences, their performance, and the related coding problems are investigated. Chung-Chin Lu 呂忠津 1994 學位論文 ; thesis 60 zh-TW |
collection |
NDLTD |
language |
zh-TW |
format |
Others
|
sources |
NDLTD |
description |
碩士 === 國立清華大學 === 電機工程研究所 === 82 === A bit deletion or insertion will result in a catastrophic
destruction in data transmission. Both error events are called
synchronization errors. In this thesis, we discuss techniques
which transfer synchronization errors into bursty erasures by
periodically inserting a synchronization sequence into data
sequences. Erasures can be corrected by an outer error-
correcting code. Extensions of these techniques to runlength-
limited sequences which are commonly used in magnetic (optical)
storage systems are proposed. When the number of
synchronization errors is over the capacity of the
synchronization sequence, thesis techniques may cause block-
level deletions or insertions. We propose two methods to avoid
this undesired phenomena. Properties of synchronization
sequences to runlength-limited sequences, their performance,
and the related coding problems are investigated.
|
author2 |
Chung-Chin Lu |
author_facet |
Chung-Chin Lu Tsung-Hui Chen 陳宗慧 |
author |
Tsung-Hui Chen 陳宗慧 |
spellingShingle |
Tsung-Hui Chen 陳宗慧 A Design of Deletion/Insertion Correcting Runlength-Limited Code |
author_sort |
Tsung-Hui Chen |
title |
A Design of Deletion/Insertion Correcting Runlength-Limited Code |
title_short |
A Design of Deletion/Insertion Correcting Runlength-Limited Code |
title_full |
A Design of Deletion/Insertion Correcting Runlength-Limited Code |
title_fullStr |
A Design of Deletion/Insertion Correcting Runlength-Limited Code |
title_full_unstemmed |
A Design of Deletion/Insertion Correcting Runlength-Limited Code |
title_sort |
design of deletion/insertion correcting runlength-limited code |
publishDate |
1994 |
url |
http://ndltd.ncl.edu.tw/handle/54053939670754479439 |
work_keys_str_mv |
AT tsunghuichen adesignofdeletioninsertioncorrectingrunlengthlimitedcode AT chénzōnghuì adesignofdeletioninsertioncorrectingrunlengthlimitedcode AT tsunghuichen kěgèngzhèngwèiyuánshānchúchārùdeliánxùxiāngtóngfúhàozhǎngdùxiànzhìmǎ AT chénzōnghuì kěgèngzhèngwèiyuánshānchúchārùdeliánxùxiāngtóngfúhàozhǎngdùxiànzhìmǎ AT tsunghuichen designofdeletioninsertioncorrectingrunlengthlimitedcode AT chénzōnghuì designofdeletioninsertioncorrectingrunlengthlimitedcode |
_version_ |
1718353121358381056 |