Built-In Self-Test Techniques Using Boundary Scan Standard Circuitry
碩士 === 國立清華大學 === 電機工程研究所 === 82 === Built-in self-test (BIST) is a design method which attempts to deal with the inherent complex -ity of testing the VLSI circuits. It requires hardware overhead to incorporate a test pattern generator, an...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1994
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| Online Access: | http://ndltd.ncl.edu.tw/handle/45121662402168740549 |