Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries
碩士 === 國立交通大學 === 工業工程研究所 === 82 === The purpose of this paper is to choose the optimum reliability stress screening process parameters under the requirement of the minimum total cost that relate to reliability stress screening process. In this paper, we use IBM failure rate model as a base for d...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1994
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| Online Access: | http://ndltd.ncl.edu.tw/handle/79998062196527635322 |