Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries

Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries

碩士 === 國立交通大學 === 工業工程研究所 === 82 === 　　The purpose of this paper is to choose the optimum reliability stress screening process parameters under the requirement of the minimum total cost that relate to reliability stress screening process. In this paper, we use IBM failure rate model as a base for d...

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Bibliographic Details
Main Authors: Gau, Ming-Kuang, 高明寬
Other Authors: Tai, Chiu-Yung
Format: Others
Language:zh-TW
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/79998062196527635322
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spelling ndltd-TW-082NCTU30300242016-07-18T04:09:41Z http://ndltd.ncl.edu.tw/handle/79998062196527635322 Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries 可靠度應力篩選程序分析-IBM失效率模型於電子工業之應用 Gau, Ming-Kuang 高明寬 碩士 國立交通大學 工業工程研究所 82 　　The purpose of this paper is to choose the optimum reliability stress screening process parameters under the requirement of the minimum total cost that relate to reliability stress screening process. In this paper, we use IBM failure rate model as a base for data analysis. The effect of screening stress level for the latent defect in systems and it's failure rate bathtub curve will be discussed. A new method will be developed for the estimate of external cost. The purpose of all the work above is to build an optimum cost model for the screening stress processes. Tai, Chiu-Yung Perng, Horng-Linn 戴久永 彭鴻霖 1994 學位論文 ; thesis 36 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 工業工程研究所 === 82 === 　　The purpose of this paper is to choose the optimum reliability stress screening process parameters under the requirement of the minimum total cost that relate to reliability stress screening process. In this paper, we use IBM failure rate model as a base for data analysis. The effect of screening stress level for the latent defect in systems and it's failure rate bathtub curve will be discussed. A new method will be developed for the estimate of external cost. The purpose of all the work above is to build an optimum cost model for the screening stress processes.
author2 Tai, Chiu-Yung
author_facet Tai, Chiu-Yung
Gau, Ming-Kuang
高明寬
author Gau, Ming-Kuang
高明寬
spellingShingle Gau, Ming-Kuang
高明寬
Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries
author_sort Gau, Ming-Kuang
title Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries
title_short Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries
title_full Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries
title_fullStr Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries
title_full_unstemmed Analysis Of Reliability Stress Screening Processes-Use IBM failure Rate Model In Electronic Industries
title_sort analysis of reliability stress screening processes-use ibm failure rate model in electronic industries
publishDate 1994
url http://ndltd.ncl.edu.tw/handle/79998062196527635322
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