Integrated Circuit Yield Estimation - Using Modified Poisson Model
碩士 === 國立交通大學 === 工業工程研究所 === 82 === As the complexity of integrated circuits rise, the size of chip increases and the clustering of defects emerges, existing yield models, such as the Poisson model, gradually result in deviation and thus become impractical. Even the negative binominal model w...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1994
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| Online Access: | http://ndltd.ncl.edu.tw/handle/14407550489981269616 |