Test pattern generators using BDD and MTBDD
碩士 === 國立交通大學 === 電子研究所 === 82 === In this thesis, we use the Binary Decision Diagram (BDD) and Multiple Terminated Binary Decision Diagram (MTBDD) to generate the test patterns for combinational circuits. This approach is very efficient...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1994
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| Online Access: | http://ndltd.ncl.edu.tw/handle/13010801424224686794 |